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Mitech Co.,  Ltd
Mitech Co., Ltd
China
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    New Ultrasonic flaw detector MFD650C

    Price:
    negotiation
    Quantity Order:
    Origin:
    China
    Payment Method:
    Telegraphic Transfer (T/T)
    Quantity:
    negotiate
    Pack. & Delivery:
    Negotiate
    Display
    Hi-resolution ( 320Ã 240 pixels) multi-color TFT LCD with 4 user-selectable brightness control provides high contrast viewing of the waveform from bright, direct sunlight to complete darkness.
    The hi-resolution multi-color TFT LCD display with fast 60 Hz update gives an â analog lookâ to the waveform providing detailed information that is critical in many applications including nuclear power plant inspections.
    Range
    Up to 9999 mm in steel; range selectable in fixed steps or continuously variable. Suitable for use on large work pieces and in high-resolution measurements.
    Pulser
    Pulse Energy selectable among 200V, 300V, 400V, 500V and 600V.
    Pulse Width tunable from 0.1µ s to 0.5 µ s to match the probes with different frequency.
    Pulse Repetition Frequency adjustable from 10 Hz to 1 KHz in 1 Hz increments.
    Test Modes include Pulse echo, dual and thru-transmission.
    Four selectable damping settings for optimum probe performance.
    Receiver
    Sampling 10 digit AD Converter at the sampling speed of 160 MHz
    Rectification Positive Halfwave, Negative Halfwave, Fullwave and RF
    Analog Bandwidth: 0.5MHz to 15MHz capability with selectable frequency ranges ( automatically set by the instrument) to match probe for optimum performance.
    Gain 0 dB to 110 dB adjustable in selectable steps 0.1 dB, 1dB, 2 dB, 6 dB, and locked.
    Gates
    Two fully independent gates offer a range of measurement options for signal height or distance using peak triggering.
    The echo-to-echo mode allows accurate gate positioning for signals which are extremely close together; selectable flank or peak detection.
    Gate Start: Variable over entire displayed range
    Gate Width: Variable from Gate Start to end of displayed range
    Gate Height: Variable from 0 to 99% Full Screen Height
    Alarms: Threshold positive/ negative
    Memory
    Memory of 100 channel files to store calibration set-ups
    Memory of 1000 wave files to store A-Scan patterns and instrument settings.
    All the files can be stored, recalled and cleared.
    Functions
    Semiautomatic two point calibration: Automated calibration of transducer zero offset and/ or material velocity
    Flaw Locating Live display Sound-path, Projection ( surface distance) , Depth, Amplitude,
    Flaw sizing: Automatic flaw sizing using AVG/ AVG or DAC, speeds reporting of defect acceptance or rejection.
    Digital Readout and Trig. Function: Thickness/ Depth can be displayed in digital readout when using a normal probe and Peam path, Surface Distance and Depth are directly displayed when angle probe is in use.
    Both the DAC and the AVG method of amplitude evaluation are available.
    Curved Surface Correction feature
    Crack Height Measure function
    Weld figure feature
    Magnify gate spreading of the gate range over the entire screen width
    Video Recording and play
    Auto-gain function
    Envelope: Simultaneous display of live A-scan at 60 Hz update rate and envelope of A-scan display
    Peak Hold: Compare frozen peak waveforms to live A-Scans to easily interpret test results.
    A Scan Freeze Display freeze holds waveform and sound path data
    B Scan display feature
    Any question pls feel free to contact me doris.ndt at gmail.com


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