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Shanghai W& T Detection Technology Co., Ltd
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    Inverted Metallurgical Microscope XJP-6A

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    Specification :

    Modern design inverted metallographic bench microscope for measuring and viewing surfaces and studying materials, equipped with a polarised light set for crystallographic analysis.
    • Binocular head with seperate photo tube for photography & video
    • Rotatable precision engineered quadruple (4) nosepiece
    • Plan LWD objective set 10X/0.25, 20X/0.40, 40X/0.65, 100X/1.25
    • Widefield WF10X/18 eyepieces (2)
    • Widefield WF12X/14 eyepieces (2)
    • Widefield WF10X/14 measuring eyepiece
    • Large mechanical stage ( 7 x 6 inch) with co-axial controls for X and Y
    • Co-axial coarse and fine focus control
    • Halogen 6V20W illumination with field diaphragm and brightness control
    • Polarising filters included
    • ACCESSORIES: reflex 35mm camera adapter, video eyepiece



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